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- // SPDX-License-Identifier: GPL-2.0
- /*
- * Copyright (c) 2018, STMicroelectronics
- */
- #include <common.h>
- #include <serial.h>
- #include <dm.h>
- #include <dm/test.h>
- #include <test/ut.h>
- static int dm_test_serial(struct unit_test_state *uts)
- {
- struct udevice *dev_serial;
- ut_assertok(uclass_get_device_by_name(UCLASS_SERIAL, "serial",
- &dev_serial));
- ut_assertok(serial_tstc());
- /*
- * test with default config which is the only one supported by
- * sandbox_serial driver
- */
- ut_assertok(serial_setconfig(SERIAL_DEFAULT_CONFIG));
- /*
- * test with a serial config which is not supported by
- * sandbox_serial driver: test with wrong parity
- */
- ut_asserteq(-ENOTSUPP,
- serial_setconfig(SERIAL_CONFIG(SERIAL_PAR_ODD,
- SERIAL_8_BITS,
- SERIAL_ONE_STOP)));
- /*
- * test with a serial config which is not supported by
- * sandbox_serial driver: test with wrong bits number
- */
- ut_asserteq(-ENOTSUPP,
- serial_setconfig(SERIAL_CONFIG(SERIAL_PAR_NONE,
- SERIAL_6_BITS,
- SERIAL_ONE_STOP)));
- /*
- * test with a serial config which is not supported by
- * sandbox_serial driver: test with wrong stop bits number
- */
- ut_asserteq(-ENOTSUPP,
- serial_setconfig(SERIAL_CONFIG(SERIAL_PAR_NONE,
- SERIAL_8_BITS,
- SERIAL_TWO_STOP)));
- return 0;
- }
- DM_TEST(dm_test_serial, DM_TESTF_SCAN_FDT);
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